5 vacatures in Spectroscopie bij Advanced Research Center for Nanolithography ARCNL

Hier vind je vacatures in Spectroscopie bij Advanced Research Center for Nanolithography ARCNL. Wil je nieuwe vacatures ontvangen op dezelfde dag dat ze worden gepubliceerd? Maak dan een e-mailalert aan.

Zoekresultaten (5)
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Advanced Research Center for Nanolithography ARCNL
Amsterdam, Nederland

PhD: Imaging Spectroscopy for Broadband EUV Source Size Characterization

Work Activities This fully funded PhD position is part of a Holland High Tech (TKI HTSM) grant titled “Imaging Spectroscopy for Broadband EUV Source Size Characterization (ImSpec)”, a collaboration...

1 week geleden geplaatst
Closing in: 4 days
PhD
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Advanced Research Center for Nanolithography ARCNL
Amsterdam, Nederland

PhD: Imaging Spectroscopy for Broadband EUV Source Size Characterization

Work ActivitiesThis fully funded PhD position is part of a Holland High Tech (TKI HTSM) grant titled “Imaging Spectroscopy for Broadband EUV Source Size Characterization (ImSpec)”, a collaboration between the Advanced Research Center for Nanolitho...

1 maand geleden geplaatst
PhD
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Advanced Research Center for Nanolithography ARCNL
Amsterdam, Nederland

PhD: Electron-induced damage mechanisms in SEM imaging

Work ActivitiesThe goal of the project is to learn more about the possible detrimental effects of electrons in scanning electron microscopy for metrology applications, on materials used in the semiconductor industry. As a PhD student you will use ...

2 maanden geleden geplaatst
PhD
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Advanced Research Center for Nanolithography ARCNL
Amsterdam, Nederland

Postdoc: electron-induced damage mechanisms in SEM imaging

Work ActivitiesThe goal of the project is to learn more about the possible detrimental effects of electrons in scanning electron microscopy for metrology applications, on materials used in the semiconductor industry. As a Postdoctoral Researcher y...

2 maanden geleden geplaatst
Postdoc
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Advanced Research Center for Nanolithography ARCNL
Amsterdam, Nederland

PhD: Terahertz and optical metrology of semiconductor material changes

Work ActivitiesIn semiconductor device manufacturing, metrology tools are required for wafer alignment, overlay and device inspection. As devices become more complicated and as stronger light sources are being used to get sufficient signal from sa...

2 maanden geleden geplaatst
PhD